Leuze

Leuze BPS 307i SM 100 Bar code positioning system

SKU:

BPS 307i SM 100

UPC:

MPN:

50125679

Condition:

New

Series:

BPS 300i

MTTF:

83 years

Depth of field:

50 ... 170 mm

Light source:

Laser, Red

Laser class:

1, in accordance with IEC 60825-1:2014 (EN 60825-1:2014)

Transmitted-signal shape:

Continuous

Light beam exit:

Lateral

Measurement range:

0 ... 10,000,000 mm

Reproducibility (1 sigma):

0.05 mm

Measurement value output:

0.05 ... 2 ms

Max. traverse rate:

10 m/s

Supply voltage UB:

18 ... 30 V, DC

Power consumption, max.:

3.7 W

Number of inputs/outputs selectable:

2 Piece(s)

Switching element:

Transistor, PNP

Type:

SSI

Function:

Process

Type:

USB

Function:

Configuration/parameterization via integrated web server,Service

Design:

Cubic

Dimension (W x H x L):

100 mm x 108.7 mm x 48.3 mm

Housing material:

Metal

Lens cover material:

Glass

Net weight:

580 g

Type of fastening:

Dovetail grooves,Fastening on back,Via optional mounting device

Type of display:

LED

Ambient temperature, operation:

-5 ... 50 °C

Ambient temperature, storage:

-35 ... 70 °C

Relative humidity (non-condensing):

90 %

Degree of protection:

IP 65, EN 60529 with various connectors or screwed-on caps

Protection class:

III

Approvals:

c UL US

Test procedure for EMC in accordance with standard:

EN 61000-6-2,EN 61000-6-3

Test procedure for shock in accordance with standard:

IEC 60068-2-27, test Ea

Test procedure for continuous shock in accordance with standard:

IEC 60068-2-29, test Eb

Test procedure for vibration in accordance with standard:

IEC 60068-2-6, test Fc

Customs tariff number:

84719000

ECLASS 5.1.4:

27280190

ECLASS 8.0:

27280190

ECLASS 9.0:

27280190

ECLASS 10.0:

27280190

ECLASS 11.0:

27280190

ECLASS 12.0:

27280106

ECLASS 13.0:

27280106

ECLASS 14.0:

27280106

ECLASS 15.0:

27280106

ETIM 5.0:

EC001825

ETIM 6.0:

EC001825

ETIM 7.0:

EC001825

ETIM 8.0:

EC001825

ETIM 9.0:

EC001825

ETIM 10.0:

EC001825

Datasheet:

View

Brochure:

View

Declaration of Conformity:

View